This inventor holds 1 USPTO granted patent. Top assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi Limited. Active years: 1997.
Company Filing History:
1 out of 10,862 
1 out of 71 
Years Active: 1997
Title: Yoshisuke Kitamura: Innovator in Probe Test Apparatus Technology
Introduction
Yoshisuke Kitamura is a notable inventor based in Yamanashi, Japan. He has made significant contributions to the field of semiconductor testing technology. His innovative work has led to the development of a unique probe test apparatus that enhances the efficiency of wafer testing.
Latest Patents
Yoshisuke Kitamura holds a patent for a probe test apparatus. This apparatus comprises a test section for testing a wafer, a cassette with an opening for wafer access, and grooves to hold the wafers securely. A convex member projects downward from the cassette's underside, while a stage maintains the wafers in a horizontal position. The design allows for precise positioning of the cassette relative to the test section, ensuring optimal testing conditions.
Career Highlights
Throughout his career, Yoshisuke Kitamura has worked with prominent companies in the semiconductor industry. He has been associated with Tokyo Electron Limited and Tokyo Electron Yamanashi Limited. His experience in these organizations has contributed to his expertise in developing advanced testing technologies.
Collaborations
Yoshisuke Kitamura has collaborated with Munetoshi Nagasaka, further enhancing his work in the field of semiconductor testing. Their partnership has likely led to innovative solutions and advancements in technology.
Conclusion
Yoshisuke Kitamura's contributions to the field of probe test apparatus technology demonstrate his innovative spirit and dedication to improving semiconductor testing processes. His patent and career achievements reflect his significant impact on the industry.