Takarazuka, Japan

Yoshikazu Wakizaka

USPTO Granted Patents = 5 

 

Average Co-Inventor Count = 4.1

ph-index = 2

Forward Citations = 5(Granted Patents)


Location History:

  • Kobe, JP (2019)
  • Hyogo, JP (2017 - 2020)
  • Takarazuka, JP (2019 - 2020)

Company Filing History:


Years Active: 2017-2020

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5 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Yoshikazu Wakizaka

Introduction

Yoshikazu Wakizaka is a notable inventor based in Takarazuka, Japan. He has made significant contributions to the field of inspection devices and systems, holding a total of 5 patents. His work focuses on the analysis and inspection of dielectric particles in various applications.

Latest Patents

Wakizaka's latest patents include an inspection device, an inspection system, and an inspection method. The inspection device is designed to inspect the amount of dielectric particles contained in a sample liquid. It features a dielectric collection unit, a pump unit, and an AC voltage supply unit. The dielectric collection unit consists of at least one pair of electrodes and a flow channel that extends in a predetermined direction. The pump unit is responsible for feeding the sample liquid through the flow channel, while the AC voltage supply unit provides an AC voltage with a predetermined frequency to facilitate dielectrophoresis for the dielectric particles in the sample liquid. Additionally, the dielectric collection unit includes multiple slit regions aligned in the predetermined direction between the electrodes, allowing for effective separation of the dielectric particles.

Another significant patent is the analysis device and separation device, which analyzes the crossover frequency at which the dielectrophoretic force on dielectric particles switches between repulsive and attractive forces. This device comprises a flow channel, a pair of electrodes, a power supply, an imaging unit, and an analyzer. The sample solution containing dielectric particles flows through the channel, and the imaging unit captures the movement trajectory of the particles. The analyzer then determines the crossover frequency based on the captured images.

Career Highlights

Wakizaka has worked with several prominent companies, including Afi Corporation and Bando Chemical Industries, Inc. His experience in these organizations has contributed to his expertise in developing innovative inspection technologies.

Collaborations

Wakizaka has collaborated with notable individuals in his field, including Masayo Takano and Takaharu Enjoji. These collaborations have further enhanced his research and development efforts.

Conclusion

Yoshikazu Wakizaka's contributions to the field of inspection devices and systems demonstrate his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of dielectric particles and their applications, making him a significant figure in his industry.

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