The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Jan. 27, 2017
Afi Corporation, Kyoto, JP;
Kyoto University, Kyoto, JP;
Yoshikazu Wakizaka, Hyogo, JP;
Masayo Takano, Tokyo, JP;
Takayuki Itoi, Osaka, JP;
Takaharu Enjoji, Tokyo, JP;
Masakazu Toi, Kyoto, JP;
Tomomi Nishimura, Kyoto, JP;
AFI CORPORATION, Kyoto, JP;
Abstract
An analysis device () analyzes a crossover frequency at which a dielectrophoretic force on dielectric particles switches from a repulsive force to an attractive force or from the attractive force to the repulsive force, comprising a flow channel (), a pair of electrodes (), a power supply (), an imaging unit () and an analyzer (). Through the flow channel (), a sample solution containing the dielectric particles in the dielectrophoretic liquid flows. The pair of electrodes () are arranged in the first channel. The power supply () applies a frequency-modulated AC voltage to the first electrodes (). The imaging unit () captures an image of a movement trajectory of each of the dielectric particles flowing between the electrodes () in the flow channel. The analyzer () obtains the crossover frequency of the dielectric particles based on the captured image of the movement trajectory.