The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 2020
Filed:
Oct. 30, 2019
Afi Corporation, Kyoto, JP;
Takaharu Enjoji, Tokyo, JP;
Yoshikazu Wakizaka, Takarazuka, JP;
Satoshi Uchida, Hachiouji, JP;
Eiko Kato, Tama, JP;
Masayo Takano, Kobe, JP;
AFI CORPORATION, Kyoto, JP;
Abstract
An inspection device () inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (), a pump unit () and an AC voltage supply unit (). The dielectric collection unit includes at least one pair of electrodes () and a flow channel () extending in a predetermined direction on the pair of electrodes. The pump unit is configured to feed the sample liquid to follow the flow channel in the predetermined direction. The AC voltage supply unit is configured to supply, to the pair of electrodes, an AC voltage with a predetermined frequency to cause dielectrophoresis for dielectric particles in the fed sample liquid. The dielectric collection unit includes a plurality of slit regions (Rs) aligned in the predetermined direction between the pair of electrodes. Each of the plurality of slit regions is separated from each other within the flow channel.