Afi Corporation

Bando Chemical Industries, Inc.

Kyoto University

Yoshikazu Wakizaka

Masayo Takano

Takaharu Enjoji

Hirofumi Miyata

Yasushi Chida

Satoshi Uchida

Eiko Kato

Masakazu Toi

Takayuki Itoi

Tomomi Nishimura

An inspection device () inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (), a pump unit () and an AC voltage supply unit (). The dielectric collection unit includes at least one pair of electrodes () and a flow channel () extending in a predetermined direction on the pair of electrodes. The pump unit is configured to feed the sample liquid to follow the flow channel in the predetermined direction. The AC voltage supply unit is configured to supply, to the pair of electrodes, an AC voltage with a predetermined frequency to cause dielectrophoresis for dielectric particles in the fed sample liquid. The dielectric collection unit includes a plurality of slit regions (Rs) aligned in the predetermined direction between the pair of electrodes. Each of the plurality of slit regions is separated from each other within the flow channel.

Inspection device, inspection system, and inspection method

An analysis device () analyzes a crossover frequency at which a dielectrophoretic force on dielectric particles switches from a repulsive force to an attractive force or from the attractive force to the repulsive force, comprising a flow channel (), a pair of electrodes (), a power supply (), an imaging unit () and an analyzer (). Through the flow channel (), a sample solution containing the dielectric particles in the dielectrophoretic liquid flows. The pair of electrodes () are arranged in the first channel. The power supply () applies a frequency-modulated AC voltage to the first electrodes (). The imaging unit () captures an image of a movement trajectory of each of the dielectric particles flowing between the electrodes () in the flow channel. The analyzer () obtains the crossover frequency of the dielectric particles based on the captured image of the movement trajectory.

Analysis device and separation device

A more accurate tension of a belt or a more accurate target natural frequency of the belt when the belt tension is adjusted is determined. A method for calculating a belt tension includes receiving a natural frequency of a belt and a span; performing calculation for determining a tension of the belt using a predetermined expression, based on the natural frequency, the span, and a unit mass of the belt read from a memory; and displaying the tension on a display, wherein in a case where the span is within a predetermined range corresponding to the belt, the predetermined expression is corrected so that an error caused by a bending stiffness of the belt is reduced.

Belt tension calculating program, belt natural frequency calculating program, method and device for calculating belt tension, and method and device for calculating belt natural frequency

A natural-frequency measurement device for measuring the natural frequency of a belt includes: an acceleration sensor attached to a portion of the belt between an adjacent pair of pulleys to sense acceleration resulting from the vibration of the belt; and a measuring instrument configured to measure the natural frequency of the belt based on the acceleration sensed by the acceleration sensor.

Natural-frequency measurement device

Growing community of inventors

Takarazuka, Japan

Yoshikazu Wakizaka