Company Filing History:
Years Active: 2024-2025
Title: Innovations of Yoshihiro Satou
Introduction
Yoshihiro Satou is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of substrate and surface inspection devices. With a total of 3 patents to his name, Satou's work has advanced the technology used in various inspection processes.
Latest Patents
One of Satou's latest inventions is a substrate inspection device. The purpose of this invention is to provide a device that increases the flatness of a substrate during inspection and improves the detection sensitivity of foreign matter. This device features a turntable on which the substrate is mounted and a clamp mechanism that holds the substrate in place. The clamp mechanism includes an abutting part that moves in the in-plane direction of the substrate, pressing it for better inspection.
Another notable invention is a surface inspection device. This device comprises a plate-shaped sample holding member that can hold a sample, a spindle motor for rotating the sample holding member, and a turntable fixed to the spindle motor. The design allows for accurate displacement of the sample in the focus direction, enhancing the precision of surface inspections.
Career Highlights
Yoshihiro Satou is currently employed at Hitachi High-Tech Corporation, where he continues to innovate and develop advanced inspection technologies. His work has been instrumental in improving the efficiency and accuracy of inspection processes in various industries.
Collaborations
Satou collaborates with Hitoshi Matsuno, a fellow innovator, to further enhance their research and development efforts in the field of inspection devices.
Conclusion
Yoshihiro Satou's contributions to substrate and surface inspection technologies have made a significant impact in the industry. His innovative patents reflect his commitment to advancing technology and improving inspection processes.