This inventor holds 3 USPTO granted patents. Top assignee: Zhejiang University. Active years: 2015-2023.
Location History:
- Hangzhou, CN (2015)
- Zhejiang, CN (2019 - 2023)
Company Filing History:
Years Active: 2015-2023
Title: Yongying Yang: Innovator in Optical Component Defect Detection
Introduction
Yongying Yang is a prominent inventor based in Zhejiang, China. He has made significant contributions to the field of optical component defect detection, holding a total of 3 patents. His innovative approaches have enhanced the accuracy and efficiency of defect evaluation in spherical optical components.
Latest Patents
One of his latest patents is a "Real-time traceability method of width of defect based on divide-and-conquer." This invention addresses the challenges of accurately measuring the width of defects in real time, particularly those close to the diffraction limit of the system. By utilizing a calibration transfer function and multidimensional eigenvector analysis technology, this method significantly improves defect detection capabilities.
Another notable patent is the "Surface defects evaluation system and method for spherical optical components." This invention employs microscopic scattering dark-field imaging to implement sub-aperture scanning of spherical surfaces. It allows for the automatic quantitative evaluation of surface defects, enhancing inspection efficiency and precision while minimizing subjective influences on results.
Career Highlights
Yongying Yang is affiliated with Zhejiang University, where he continues to advance research in optical technologies. His work has been instrumental in developing methods that improve the reliability of optical components used in various applications.
Collaborations
He has collaborated with notable colleagues, including Weimin Lou and Fanyi Wang, contributing to the advancement of research in his field.
Conclusion
Yongying Yang's innovative patents and contributions to optical component defect detection demonstrate his commitment to enhancing technology in this area. His work not only addresses existing challenges but also paves the way for future advancements in optical engineering.