Yongfa Liu

Title: Yongfa Liu: Inventor in Defect Detection

Introduction

Yongfa Liu is an inventor based in Ningde, China, whose patent work focuses on image-based defect detection and classification. His portfolio includes 2 patents.

Latest Patents

Liu’s recent patents describe methods and devices for identifying defects in images.

“Method and Device for Defect Detection” calculates similarity scores between an image’s defect features and known defect types. These scores help distinguish known defects from unknown ones and classify known defects.

“Defect Detection Method, Device and System” uses an image’s average grayscale value to construct a mapping table and identify suspicious regions. The resulting sub-image is then provided to a machine-learning model for further analysis.

Career Highlights

Liu’s listed company affiliations include Contemporary Amperex Technology (Hong Kong) Limited and Contemporary Amperex Technology Limited. His patent work applies image processing and machine learning to defect detection.

Collaborations

Liu’s listed coworkers include Maolong Niu and Qiangwei Huang.

Conclusion

Yongfa Liu’s patents address practical approaches to detecting and classifying image defects, combining grayscale analysis, feature similarity, and machine learning.