The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 2026
Filed:
Sep. 12, 2023
Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;
Maolong Niu, Ningde, CN;
Qiangwei Huang, Ningde, CN;
Jintan Xie, Ningde, CN;
Yongfa Liu, Ningde, CN;
CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED, Hong Kong, CN;
Abstract
A defect detection method includes: obtaining an average grayscale value of an image; constructing a mapping table, where elements of the mapping table include a mapped value corresponding to each grayscale value within a grayscale value range of the image, a mapped value corresponding to a grayscale value greater than or equal to a reference value is a first value, a mapped value corresponding to a grayscale value less than the reference value is a second value, and the reference value is an absolute value of a difference between the average grayscale value and a preset grayscale value; searching for a mapped value corresponding to a grayscale value of each pixel in the image from the mapping table; segmenting the image to obtain a suspicious defect sub-image based on the mapped value corresponding to the grayscale value of each pixel; and inputting the suspicious defect sub-image into a machine learning model.