This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Jintan Xie: Patent Activity in Image-Based Defect Detection
Introduction
Jintan Xie is an inventor associated with Ningde, China. Her patent work includes a method for identifying potential defects in images using grayscale analysis and machine learning.
Latest Patents
The provided information lists one patent for Xie: “Defect Detection Method, Device and System.” The method calculates an image’s average grayscale value and uses a reference value based on the difference between that average and a preset grayscale value. It then maps grayscale values, segments the image to identify a suspicious defect sub-image, and inputs that sub-image into a machine-learning model. This approach combines image processing with machine learning to support defect detection.
Career Highlights
Xie is associated with Contemporary Amperex Technology (Hong Kong) Limited and Contemporary Amperex Technology Limited. Her listed patent reflects work on automated image analysis and defect identification.
Collaborations
Her listed coworkers include Maolong Niu and Qiangwei Huang, who are also named in connection with her patent work.
Conclusion
Jintan Xie’s listed invention applies grayscale mapping, image segmentation, and machine learning to defect detection, highlighting her contribution to image-based inspection technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile