This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Contemporary Amperex Technology (Hong Kong) Limited. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Maolong Niu: Inventor in Defect Detection
Introduction
Maolong Niu is an inventor associated with Ningde, China. His work includes a patent for an image-based defect detection method that uses grayscale analysis and machine learning.
Latest Patents
Niu is listed as an inventor on 1 patent: “Defect Detection Method, Device and System.” The method calculates an image’s average grayscale value and uses a reference value based on the difference between that average and a preset grayscale value. It then maps grayscale values, segments the image to identify a suspicious defect sub-image, and inputs that sub-image into a machine learning model.
Career Highlights
Niu is associated with Contemporary Amperex Technology (Hong Kong) Limited and Contemporary Amperex Technology Limited. His patent describes an approach to identifying potential defects in images through grayscale-based segmentation and machine learning.
Collaborations
Niu’s named coworkers include Qiangwei Huang and Jintan Xie.
Conclusion
Maolong Niu’s patent work combines image processing and machine learning to support the detection of potential defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile