Itami, Japan

Yoji Mashiko


Average Co-Inventor Count = 3.1

ph-index = 7

Forward Citations = 145(Granted Patents)


Location History:

  • Nishinomiya, JP (1983)
  • Takarazuka, JP (1983 - 1988)
  • Itami, JP (1982 - 1992)
  • Hyogo, JP (1991 - 1992)
  • Tokyo, JP (2003)

Company Filing History:


Years Active: 1982-2003

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16 patents (USPTO):

Title: Yoji Mashiko: Innovator in Scanning Probe Microscopy

Introduction

Yoji Mashiko is a prominent inventor based in Itami, Japan. He has made significant contributions to the field of microscopy, holding a total of 16 patents. His work focuses on enhancing measurement precision and analyzing impurities in various materials.

Latest Patents

One of Mashiko's latest inventions is a scanning probe microscope designed to effectively suppress reductions in measurement precision. This innovative device features a conductive probe with a pyramid structure that expands from the tip to the bottom surface, where a cantilever is formed. Additionally, a semiconductor integrated circuit is incorporated into the side surface of the conductive probe. This amplifying circuit enhances the electrical characteristic signal from the probe, transmitting it to a signal processor through a conductive cantilever and signal cable.

Another notable patent involves a method for detecting and analyzing impurities. This method entails cleaning a substrate by heating it under vacuum conditions. A liquid sample is then dropped onto the substrate's surface under a lower vacuum. The sample is dried by reducing the surrounding atmospheric pressure, allowing for precise detection and analysis of impurities on the substrate's surface. This approach minimizes the risk of foreign matter contaminating the sample, ensuring high precision in the analysis.

Career Highlights

Yoji Mashiko is associated with Mitsubishi Electric Corporation, where he has contributed to various innovative projects. His expertise in microscopy and impurity analysis has positioned him as a key figure in his field.

Collaborations

Mashiko has worked alongside notable colleagues, including Tadashi Nishioka and Hiroshi Koyama. Their collaborative efforts have further advanced the research and development of innovative technologies in microscopy.

Conclusion

Yoji Mashiko's contributions to the field of microscopy and impurity analysis highlight his innovative spirit and dedication to precision. His patents reflect a commitment to advancing technology and improving measurement techniques.

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