This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Nova Corporation. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: Yishai Schreiber: Innovator in Semiconductor Metrology
Introduction
Yishai Schreiber is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of semiconductor device metrology. His innovative work focuses on enhancing the accuracy and efficiency of measurements in semiconductor manufacturing.
Latest Patents
Yishai Schreiber holds a patent for "Time-domain optical metrology and inspection of semiconductor devices." This patent involves creating a time-domain representation of wavelength-domain measurement data of light reflected by a patterned structure of a semiconductor device. The process includes selecting relevant and irrelevant portions of the time-domain representation and determining measurements of parameters of interest through model-based processing.
Career Highlights
Yishai Schreiber is associated with Nova Corporation, a company known for its advancements in semiconductor manufacturing technology. His work has contributed to improving the precision of semiconductor inspections, which is crucial for the development of modern electronic devices.
Collaborations
Yishai has collaborated with notable colleagues, including Gilad Barak and Amir Sagiv. Their combined expertise has fostered innovation in the field of semiconductor metrology.
Conclusion
Yishai Schreiber's contributions to semiconductor metrology exemplify the importance of innovation in technology. His patent and work at Nova Corporation highlight his role as a key figure in advancing semiconductor inspection methods.