Yinxiao Miao

Title: Yinxiao Miao: Innovator in Optical Frequency Combs and Neural Networks

Introduction

Yinxiao Miao is a prominent inventor based in Beijing, China. He has made significant contributions to the fields of optical frequency combs and neural networks. With a total of 8 patents to his name, Miao's work showcases his innovative spirit and technical expertise.

Latest Patents

Miao's latest patents include a "Method and device for automatically locking repetition frequency and carrier-envelop offset frequency of optical frequency comb." This invention involves a method for automatically locking the frequency of an optical frequency comb by locking the microwave repetition frequency signal and the microwave carrier-envelop offset frequency signal. The process includes filtering, frequency division, and phase discrimination to obtain error signals, which are then used to adjust the output frequency of a frequency synthesizer.

Another notable patent is the "Method for assessing test adequacy of neural network based on element decomposition." This method assesses the test adequacy of deep neural networks by dividing network testing into black box and white box testing. Key elements are decomposed and defined, allowing for the extraction of network parameters. Importance values of neurons are calculated and clustered, leading to the generation of an importance value hot map for each layer.

Career Highlights

Yinxiao Miao has worked at esteemed institutions such as the Beijing Aerospace Institute for Metrology and Measurement Technology. His experience in these organizations has contributed to his expertise in metrology and measurement technology, further enhancing his innovative capabilities.

Collaborations

Miao has collaborated with notable colleagues, including Ke Liu and Fengju Sun. These partnerships have likely fostered a creative environment that encourages the exchange of ideas and advancements in their respective fields.

Conclusion

Yinxiao Miao's contributions to optical frequency combs and neural networks highlight his role as a leading inventor in these innovative fields. His patents reflect a commitment to advancing technology and improving methodologies in measurement and assessment.