The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 20, 2025
Filed:
Nov. 22, 2023
Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing, CN;
Yinxiao Miao, Beijing, CN;
Yifei Liu, Beijing, CN;
Ping Yang, Beijing, CN;
Xiujian Zhang, Beijing, CN;
Zhonghao Cheng, Beijing, CN;
Long Zhang, Beijing, CN;
Tianqi Wan, Beijing, CN;
Haoyi Chen, Beijing, CN;
Jing Sun, Beijing, CN;
Yijia Ding, Beijing, CN;
Abstract
A method for assessing test adequacy of deep neural networks based on element decomposition is provided. The network testing is divided into black box testing and white box testing, of which key elements are decomposed and defined. Network parameters including a weight matrix and a bias vector are extracted. Importance values of neurons in individual layers of the deep neural network are calculated and clustered, and an importance value hot map of neurons in each layer is generated based on clustering results. Mutation testing, and index calculation and evaluation are performed.