Haoyi Chen

Title: Haoyi Chen: Innovator in Neural Network Testing

Introduction

Haoyi Chen is a prominent inventor based in Beijing, China. He has made significant contributions to the field of neural networks, particularly in assessing their test adequacy. His innovative approach has garnered attention in the tech community.

Latest Patents

Haoyi Chen holds a patent titled "Method for assessing test adequacy of neural network based on element decomposition." This method provides a systematic way to evaluate the testing adequacy of deep neural networks. It involves dividing network testing into black box and white box testing, where key elements are decomposed and defined. The process includes extracting network parameters such as weight matrices and bias vectors. Furthermore, it calculates and clusters the importance values of neurons in individual layers, generating an importance value hot map based on the clustering results. The method also incorporates mutation testing, index calculation, and evaluation.

Career Highlights

Haoyi Chen is affiliated with the Beijing Aerospace Institute for Metrology and Measurement Technology. His work at this institute has allowed him to explore advanced methodologies in neural network testing. His innovative contributions have positioned him as a key figure in the field.

Collaborations

Haoyi Chen collaborates with talented individuals such as Yinxiao Miao and Yifei Liu. Their combined expertise enhances the research and development efforts in neural network technologies.

Conclusion

Haoyi Chen's work in assessing neural network test adequacy showcases his innovative spirit and dedication to advancing technology. His contributions are paving the way for more effective testing methodologies in the field of artificial intelligence.