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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10746857 B1

PDFFull Text
Date of Patent:
Aug. 18, 2020

Filed:

Jan. 08, 2018

Method for correcting measuring errors of long-distance scanning laser radar

Applicants:

Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing, CN;

China Academy of Launch Vehicle Technology, Beijing, CN;

Inventors:

Ke Liu, Beijing, CN;

Yinxiao Miao, Beijing, CN;

Jincheng Song, Beijing, CN;

Zengyu Sun, Beijing, CN;

Lizhen Guo, Beijing, CN;

Hao Zhu, Beijing, CN;

Assignees:

Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing, CN;

China Academy of Launch Vehicle Technology, Beijing, CN;

Attorneys:

Wayne & Ken, LLC

Tony Hom

Primary Examiner:

Luke D Ratcliffe

Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 17/42 (2006.01); G01S 7/48 (2006.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 7/4808 (2013.01); G01S 17/42 (2013.01);
Abstract

The present invention relates to a method for correcting measuring errors of a long-distance scanning laser radar, comprising: S, establishing a measuring model and acquiring a positional relationship between a measured point and a coordinate origin; S, acquiring an actual positional relationship between the measured point and a laser radar and establishing error models of three major error sources; S, performing a sub-parameter measuring experiment on the laser radar to acquire major sample data of the three major error sources; S, analyzing probability density distribution of the three major error sources with a statistical method to obtain error correction samples of the three major error sources in a three-dimensional coordinate system; S, acquiring three-dimensional coordinate samples according to the error correction samples of the three major error sources and the measuring model; and S, correcting a three-dimensional coordinate measuring point in real time.

Find Patent Forward Citations

Liu, Ke. (2020). Method for correcting measuring errors of long-distance scanning laser radar (U.S. Patent No. 10746857). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10746857

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