Yingna Chen

Title: Innovations in Semiconductor Testing: The Contributions of Yingna Chen

Introduction

Yingna Chen, based in Shanghai, China, is an inventive mind known for his significant contributions to semiconductor technology. With one patent to his name, Chen has made strides in the understanding and testing of surface state carriers in semiconductors. His work holds importance for advancing semiconductor applications and enhancing the robustness of electronic devices.

Latest Patents

Yingna Chen's patent, titled "Method for Testing Lifetime of Surface State Carrier of Semiconductor," outlines a groundbreaking approach. The patented method incorporates several steps: first, a narrow pulse light source emits light pulses that are channeled into a near-field optical probe. This probe facilitates the generation of a photon-generated carrier on the semiconductor's surface through excitation. The excited carriers are then concentrated on the surface, where continuous recombination occurs with surface states acting as recombination centers. Notably, this process results in a change in lattice constant, generating a stress wave that is detected using high-frequency broadband ultrasonic testing. Finally, by fitting calculations on this detected stress wave signal, the lifetime of the surface state carrier is effectively determined.

Career Highlights

Yingna Chen works at Tongji University, a prominent institution in the field of research and innovation. His role at the university has allowed him to focus on semiconductor research, particularly in the visualizing and testing of semiconductor behaviors, further solidifying his expertise and reputation within the academic community.

Collaborations

Collaboration has played a vital role in Chen's work, and he has partnered with notable colleagues such as Qian Cheng and Weiya Xie. Together, their collective knowledge and experience contribute to the advancement of research in semiconductor technologies and the application of innovative testing methods.

Conclusion

Yingna Chen's work on semiconductor testing represents a significant leap forward in this essential field. His patented methods not only contribute to the academic landscape but also hold the potential to impact practical applications across various industries. With continued collaboration and research, Chen and his colleagues are poised to further influence the innovative landscape of semiconductor technologies.