Yingdi Liu

Title: Innovations of Yingdi Liu

Introduction

Yingdi Liu is a notable inventor based in Wilsonville, OR (US). He has made significant contributions to the field of circuit testing, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

One of his latest patents is titled "Universal compactor architecture for testing circuits." This invention involves a circuit that comprises scan gating devices inserted between outputs of scan chains and inputs of a test response compactor. The scan gating devices divide the scan chains into groups, operating in either an enabled or disenabled mode based on specific signals. This architecture allows for enhanced testing capabilities by controlling the flow of test responses from the scan chains.

Another significant patent is "Deterministic stellar built-in self test." This system for testing a circuit includes scan chains and a controller that generates a bit-inverting signal based on child test pattern information. The bit-inverting circuitry is designed to invert bits of a parent test pattern during a shift operation, thereby creating a child test pattern. This innovative approach improves the efficiency and accuracy of circuit testing.

Career Highlights

Yingdi Liu is currently employed at Siemens Industry Software GmbH, where he continues to develop cutting-edge technologies in circuit testing. His work has been instrumental in advancing the capabilities of testing systems, making them more reliable and efficient.

Collaborations

Throughout his career, Yingdi has collaborated with esteemed colleagues such as Nilanjan Mukherjee and Janusz Rajski. These collaborations have fostered an environment of innovation and have contributed to the success of various projects.

Conclusion

Yingdi Liu's contributions to the field of circuit testing through his patents and work at Siemens Industry Software GmbH highlight his role as a leading inventor. His innovative solutions continue to shape the future of technology in this domain.