Siemens Industry Software Gmbh

Yingdi Liu

Janusz Rajski

Jerzy Tyszer

Nilanjan Mukherjee

Grzegorz Mrugalski

Bartosz Wlodarczak

A circuit comprises scan gating devices inserted between outputs of scan chains and inputs of a test response compactor. The scan gating devices divides the scan chains into groups of scan chains. Each of the scan gating devices operates in either an enabled mode or a disenabled mode based on a first signal. A scan gating device operating in the enabled mode blocks, blocks only at some clock cycles, or does not block a portion of a test response of a test pattern captured by and outputted from a scan chain in the associated scan chain group based on a second signal. Scan gating devices operating in the disenabled mode do not block, or based on a third signal, either block or do not block, a portion of the test response captured by and outputted from all scan chains in each of the associated scan chain groups.

Universal compactor architecture for testing circuits

A system for testing a circuit comprises scan chains, a controller configured to generate a bit-inverting signal based on child test pattern information, and bit-inverting circuitry coupled to the controller and configured to invert bits of a parent test pattern associated with a plurality of shift clock cycles based on the bit-inverting signal to generate a child test pattern during a shift operation. Here, the plurality of shift clock cycles for bit inverting occur every m shift clock cycles, and the child test pattern information comprises information of m and location of the plurality of shift clock cycles in the shift operation.

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Wilsonville, OR, United States of America

Yingdi Liu