Hsinchu, Taiwan

Ying-Tsai Ting

This inventor holds 1 USPTO granted patent. Top assignee: Macronix International Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying-Tsai Ting. Retrieved from https://idiyas.com/inventor/ying-tsai-ting

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Ying-Tsai Ting: Innovator in Memory Testing Technology

Introduction

Ying-Tsai Ting is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of memory testing technology. His innovative approach has led to the development of a unique testing method for memory devices.

Latest Patents

Ying-Tsai Ting holds 1 patent for a test method for memory. This method involves testing a memory device that includes a memory array with multiple symmetric memory cells, word lines, and bit lines. The testing process charges specific bit lines to evaluate individual bits of adjacent symmetric memory cells, ensuring thorough testing of the memory device.

Career Highlights

Ying-Tsai Ting is currently employed at Macronix International Co., Ltd. His work at this company has allowed him to focus on advancing memory technology and improving testing methods. His expertise in this area has positioned him as a valuable asset in the field.

Collaborations

Ying-Tsai Ting has collaborated with notable colleagues, including Che-Chin Wu and Shih-Fu Huang. These collaborations have contributed to the development of innovative solutions in memory technology.

Conclusion

Ying-Tsai Ting's contributions to memory testing technology highlight his role as an influential inventor. His patent and work at Macronix International Co., Ltd. demonstrate his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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