Hong Kong, China

Ying Liu

This inventor holds 17 USPTO granted patents and 3 published patent applications, primarily in Optical Imaging Systems. Top assignees: Hong Kong Applied Science and Technology Research Institute, Asm Technology Singapore Pte Ltd, Shenzhen Dansha Technology Co., Ltd.. Active years: 2009-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying Liu. Retrieved from https://idiyas.com/inventor/ying-liu-lzs2i52r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 17 

% Patents Active = 100.0

Average Co-Inventor Count = 2.2

ph-index = 5

Forward Citations = 110(Granted Patents)


Location History:

  • Hung Hum, CN (2010)
  • New Territories, CN (2011)
  • Hong Kong, CN (2009 - 2022)

Company Filing History:


Years Active: 2009-2022

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Areas of Expertise:
3D Ultrasound Imaging
Optical Inspection
Image Projector
Light Shaping Device
Polarization Beam Splitters
Illumination Module
Backlighting Apparatus
Light Guiding Strip
Interactive Projection Device
Total Internal Reflection
Shape Measurement
Optical Components
17 patents (USPTO):Explore Patents

Title: Ying Liu - Innovator in Imaging Technology

Introduction

Ying Liu is a prominent inventor based in Hong Kong, China. He has made significant contributions to the field of imaging technology, holding a total of 17 patents. His innovative work focuses on advanced systems for ultrasound imaging and optical inspection.

Latest Patents

One of Ying Liu's latest patents is a 3D ultrasound imaging system. This system features a circuit that includes multiple sensor units, unit circuits, and row sharing circuits. The unit circuits are connected to the sensor units, allowing for efficient signal transmission and reception. Each row sharing circuit is designed to manage control signals, enabling the selection of sensor units for ultrasound signal processing.

Another notable patent is an optical inspection system. This system is designed to detect defects in objects, such as electronic devices during manufacturing. It utilizes a first linear light source to illuminate the top surface of the object and a second linear light source to target the side surface. A camera captures scattered light and processes subimages to identify defects on both surfaces.

Career Highlights

Ying Liu has worked with several esteemed organizations, including the Hong Kong Applied Science and Technology Research Institute and Shenzhen Dansha Technology Co., Ltd. His experience in these companies has allowed him to develop and refine his innovative technologies.

Collaborations

Throughout his career, Ying Liu has collaborated with notable professionals such as Shou-Lung Chen and Danding Huang. These partnerships have contributed to the advancement of his projects and the successful implementation of his inventions.

Conclusion

Ying Liu is a distinguished inventor whose work in imaging technology has led to significant advancements in ultrasound and optical inspection systems. His contributions continue to impact the industry positively, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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