The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Aug. 14, 2012
Applicants:
Zhao Wang, Hong Kong, CN;
Ying Liu, Hong Kong, CN;
Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G09G 5/02 (2006.01); G06K 9/62 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2509 (2013.01);
Abstract
The present invention discloses a non-contact measurement system for measuring the three-dimensional (3D) shape of an object rapidly by using a unique light pattern and the implementation method thereof. The system comprises a pattern generation unit, a projection unit, a sensing unit and a processing unit. The pattern generation unit generates an enhanced color sequence according to predetermined rules. The sensing unit of the system comprises a hybrid sensor which can be operated in fast mode or precise mode. A dedicated decoding method for the present invention is also disclosed.