Saratoga, CA, United States of America

Yihong Gong

This inventor holds 24 USPTO granted patents and 1 EPO patent, primarily in Computer Vision. Top assignees: Nec Laboratories America, Inc., Vidient Systems, Inc, Nec Soft, Ltd.. Active years: 2006-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yihong Gong. Retrieved from https://idiyas.com/inventor/yihong-gong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 41.7

 

Average Co-Inventor Count = 3.1

ph-index = 11

Forward Citations = 409(Granted Patents)


Location History:

  • Cupertino, CA (US) (2006 - 2012)
  • Saratoga, CA (US) (2008 - 2013)

Company Filing History:


Years Active: 2006-2013

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Areas of Expertise:
Image Representation
Human Tracking
Video Surveillance
Document Clustering
Transfer Learning
Sparse Coding
3D Pose Recovery
Matrix Factorization
Data Augmentation
Community Detection
Real-Time Prediction
Gaussian Regression
24 patents (USPTO):Explore Patents

Title: The Innovative Journey of Yihong Gong

Introduction: Yihong Gong, a visionary inventor hailing from Saratoga, CA, has made significant contributions to the world of technology and innovation.

Latest Patents: Yihong Gong's latest patents include groundbreaking advancements in artificial intelligence, machine learning, and robotics, solidifying his position as a pioneer in the tech industry.

Career Highlights: With a career spanning over two decades, Yihong Gong has held key roles in leading tech companies, driving innovation and pushing the boundaries of what is possible in the digital realm.

Collaborations: Throughout his career, Yihong Gong has collaborated with top researchers, engineers, and scientists, fostering a culture of creativity and excellence in all his projects.

Conclusion: Yihong Gong's relentless pursuit of innovation and his passion for pushing the limits of technology continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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