The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2012
Filed:
Aug. 28, 2008
Applicants:
Yun Chi, Santa Clara, CA (US);
Yihong Gong, Saratoga, CA (US);
Shenghuo Zhu, Santa Clara, CA (US);
Inventors:
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed for factorizing high-dimensional data by simultaneously capturing factors for all data dimensions and their correlations in a factor model, wherein the factor model provides a parsimonious description of the data; and generating a corresponding loss function to evaluate the factor model.
Chi, Yun. (2012). Processing high-dimensional data via em-style iterative algorithm (U.S. Patent No. 8099381). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8099381
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile