The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2012
Filed:
Oct. 10, 2007
Applicants:
Shengyang Dai, Evanston, IL (US);
Mei Han, Cupertino, CA (US);
Wei Xu, Los Gatos, CA (US);
Ying Wu, Vernon Hills, IL (US);
Yihong Gong, Saratoga, CA (US);
Inventors:
Shengyang Dai, Evanston, IL (US);
Mei Han, Cupertino, CA (US);
Wei Xu, Los Gatos, CA (US);
Ying Wu, Vernon Hills, IL (US);
Yihong Gong, Saratoga, CA (US);
Assignee:
NEC Laboratories America, Inc., Princeton, NJ (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are disclosed for processing a low resolution image by performing a high resolution edge segment extraction on the low resolution image; performing an image super resolution on each edge segment; performing reconstruction constraint reinforcement; and generating a high quality image from the low quality image.