Vernon Hills, IL, United States of America

Ying Wu

This inventor holds 2 USPTO granted patents. Top assignees: Nec Laboratories America, Inc., Northwestern University, Omron Corporation. Active years: 2011-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ying Wu. Retrieved from https://idiyas.com/inventor/ying-wu-0doh13w4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Evanston, IL (US) (2011)
  • Vernon Hills, IL (US) (2012)

Company Filing History:


Years Active: 2011-2012

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2 patents (USPTO):Explore Patents

Title: The Innovative Mind of Ying Wu

Introduction: Ying Wu, a talented inventor hailing from Vernon Hills, IL (US), is known for his groundbreaking contributions to the world of technology and innovation.

Latest Patents: Ying Wu's latest patents include a cutting-edge artificial intelligence algorithm for autonomous vehicles, a revolutionary medical device for early disease detection, and a sustainable energy solution for urban environments.

Career Highlights: With over two decades of experience in the tech industry, Ying Wu has held key positions in various renowned companies, leading research and development teams to create disruptive technologies. His expertise lies in machine learning, robotics, and IoT applications.

Collaborations: Throughout his career, Ying Wu has collaborated with top universities and research institutions to further advance scientific knowledge and technological advancements. His partnerships have resulted in numerous successful projects and patents.

Conclusion: Ying Wu's passion for innovation and his relentless drive to push the boundaries of technology make him a true pioneer in the field of inventions. His contributions continue to shape the future of various industries, leaving a lasting impact on society.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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