Yi-Wei Chang

Title: Yi-Wei Chang: Innovator in Surface Measurement and Chromatic Confocal Microscopy

Introduction

Yi-Wei Chang is a prominent inventor based in Yilan County, Taiwan. He has made significant contributions to the fields of surface measurement and microscopy, holding a total of 5 patents. His innovative work has advanced the technology used in measuring surfaces and analyzing optical signals.

Latest Patents

Yi-Wei Chang's latest patents include a surface measurement device and method, which features a rotating platform, a motion lever, a measuring module, and a control module. This device allows for precise measurement of surface heights at various sampling points, ensuring that the distance between these points adheres to a specific sampling rule. Another notable patent is his chromatic confocal microscope system, which utilizes optical fiber modules to modulate light and analyze reflected signals. This system enables the reconstruction of surface profiles by calculating RGB intensity signals, enhancing the accuracy of depth measurements.

Career Highlights

Throughout his career, Yi-Wei Chang has worked with esteemed institutions such as National Taipei University of Technology and the Industrial Technology Research Institute. His experience in these organizations has allowed him to develop and refine his innovative technologies, contributing to advancements in his field.

Collaborations

Some of Yi-Wei Chang's notable coworkers include Liang-Chia Chen and Chao-Nan Chen. Their collaborative efforts have further propelled the research and development of cutting-edge technologies in surface measurement and microscopy.

Conclusion

Yi-Wei Chang's contributions to innovation in surface measurement and microscopy demonstrate his expertise and commitment to advancing technology. His patents reflect a deep understanding of optical systems and measurement techniques, positioning him as a key figure in his field.