The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2013
Filed:
Jul. 22, 2011
Liang-chia Chen, Taipei, TW;
Yong-lin Wu, Taipei, TW;
Yi-wei Chang, Taipei, TW;
National Taipei University of Technology, Taipei, TW;
Abstract
The present invention provides a chromatic confocal microscopic system in which two conjugate fiber modules are spatially configured and employed to conduct a detecting light from a light source and an object light reflected from an object, respectively. By means of the two spatially corresponding fiber modules, the detecting light is projected on the object and the reflected light from the object is entered into the other fiber module. Since each fiber of the fiber module is capable of filtering out the unfocused light and stray lights and allowing the focused light pass therethrough a line slit, thereby minimizing potential interference from light cross talk caused by the overlapped light spots, not only can the present invention obtain the information of surface profile of the object with high vertical measurement resolution, but also achieve high lateral resolution during confocal measurement.