Yi-Lung Lee

Title: Innovations of Yi-Lung Lee

Introduction

Yi-Lung Lee is a prominent inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of technology, particularly in the development of advanced probe devices. With a total of 5 patents to his name, Lee's work is recognized for its innovation and practicality.

Latest Patents

One of Yi-Lung Lee's latest patents is the "Trace Embedded Probe Device." This device features a circuit board with an insulating layer unit that includes first and second recesses. The grounding traces and signal trace are designed to be flush with the upper surface, allowing for precise control over the distance, width, thickness, and surface roughness of the traces. This innovation is particularly beneficial for achieving thin copper traces and high-frequency testing.

Another notable patent is the "Spring Probe and Probe Card Having Spring Probe." This probe card consists of a probe seat with upper and lower dies, along with a spring probe that is inserted through a probe accommodating hole. The design includes a circuit board with a contact pad that interacts with the spring probe, enhancing the functionality and efficiency of the device.

Career Highlights

Yi-Lung Lee is currently associated with Mpi Corporation, where he continues to push the boundaries of technology through his inventive work. His contributions have not only advanced the field but have also set new standards for probe device technology.

Collaborations

Throughout his career, Yi-Lung Lee has collaborated with notable colleagues, including Horng-Kuang Fan and Tsung-Yi Chen. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Yi-Lung Lee's work exemplifies the spirit of innovation in technology. His patents reflect a deep understanding of the needs within the industry and a commitment to advancing the field. His contributions will undoubtedly continue to influence future developments in probe technology.