This inventor holds 1 USPTO granted patent. Top assignee: Applied Materials Israel Limited. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Yen Cheng Chiang: Innovator in Semiconductor Examination
Introduction
Yen Cheng Chiang is a notable inventor based in Hukou Township, Taiwan. She has made significant contributions to the field of semiconductor examination, particularly through her innovative patent. Her work focuses on enhancing the accuracy and efficiency of defect detection in semiconductor specimens.
Latest Patents
Yen Cheng Chiang holds a patent titled "Defect offset correction for examination of semiconductor specimens." This patent describes a system and method for examining semiconductor specimens. The method involves obtaining a group of defect candidates linked to specific inspection locations within an inspection coordinate system. A trained machine learning model is utilized to assess the probability of each defect candidate being a defect of interest (DOI). The candidates are then ranked based on their probabilities. The process includes reviewing a portion of the ordered list of defect candidates with a review tool, receiving a predefined number of DOIs associated with review locations, and calculating an offset between the review and inspection coordinate systems based on these locations. This innovative approach significantly improves the accuracy of semiconductor inspections.
Career Highlights
Yen Cheng Chiang is currently employed at Applied Materials Israel Limited, where she continues to develop her expertise in semiconductor technology. Her work has been instrumental in advancing the methodologies used in the industry, particularly in the realm of defect detection and correction.
Collaborations
Yen collaborates with talented colleagues, including Albert Kao and Shih-Wei Yang. Their combined efforts contribute to the ongoing advancements in semiconductor examination techniques.
Conclusion
Yen Cheng Chiang's contributions to the field of semiconductor examination through her innovative patent demonstrate her commitment to improving technology in this critical area. Her work not only enhances the accuracy of defect detection but also showcases the importance of collaboration in driving innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile