This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Applied Materials Israel Limited. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Yehuda Udy Danino: Innovator in Defect Detection Technology
Introduction
Yehuda Udy Danino is a notable inventor based in Bnei Brak, Israel. He has made significant contributions to the field of defect detection technology. His innovative approach has led to the development of a patented system that enhances the accuracy of identifying defects in various articles.
Latest Patents
Yehuda Udy Danino holds a patent for an "Apparatus and method for defect detection including patch-to-patch comparisons." This system processes inspected images to identify candidate defect locations. It defines candidate patches associated with these locations and compares them with similar patches to determine the presence of defects. This method improves the reliability of defect detection in manufacturing processes.
Career Highlights
Yehuda is currently employed at Applied Materials Israel Limited, where he applies his expertise in developing advanced technologies. His work focuses on enhancing manufacturing processes through innovative solutions. With a patent portfolio that includes 1 patent, he continues to push the boundaries of technology in his field.
Collaborations
Some of his coworkers include Michele Dalla-Torre and Boris Sherman. Their collaborative efforts contribute to the innovative environment at Applied Materials Israel Limited.
Conclusion
Yehuda Udy Danino's contributions to defect detection technology exemplify the impact of innovation in manufacturing. His patented methods are paving the way for more efficient and accurate production processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile