The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2016
Filed:
Jun. 13, 2012
Michele Dalla-torre, Givataim, IL;
Boris Sherman, Rehovot, IL;
Zion Hadad, Ashkelon, IL;
Yehuda Udy Danino, Bnei Brak, IL;
Noga Bullkich, Nahariya, IL;
Michele Dalla-Torre, Givataim, IL;
Boris Sherman, Rehovot, IL;
Zion Hadad, Ashkelon, IL;
Yehuda Udy Danino, Bnei Brak, IL;
Noga Bullkich, Nahariya, IL;
APPLIED MATERIALS ISRAEL, LTD., Rehovot, IL;
Abstract
A system receives, based on processing of an inspected frame of an inspected image generated by collecting signals indicative of a pattern on an article, at least one candidate defect location in the inspected frame. The system defines a candidate patch within the inspected frame. The candidate patch is associated with the candidate defect location. The system identifies at least one similar patch in the inspected frame using a predefined similarity criterion and determines whether a defect exists at the candidate defect location based on a comparison of at least a portion of the candidate patch with at least a corresponding portion of the at least one similar patch.