This inventor holds 1 USPTO granted patent. Top assignees: National Institute of Advanced Industrial Science and Technology, Sii Nanotechnology Inc.. Active years: 2009.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2009
Title: Yasuyuki Semba: Innovator in Scanning Magnetic Force Microscopy
Introduction
Yasuyuki Semba is a notable inventor based in Tsukuba, Japan. He has made significant contributions to the field of scanning magnetic force microscopy, particularly through his innovative patent. His work focuses on enhancing the resolution of magnetic storage medium observation.
Latest Patents
Yasuyuki Semba holds a patent for a "Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes." This invention provides a probe that achieves a resolution sufficient for observing magnetic storage media with recording densities of 1200 kFCI or higher. The probe comprises a carbon nanotube coated with a ferromagnetic alloy film, specifically a Co-Fe or Co-Ni alloy. The surface roughness of the ferromagnetic alloy film is controlled to be 1.15 nm or less, which is crucial for its functionality. The patent also details methods for producing such probes and forming the ferromagnetic alloy film while controlling the growth rate.
Career Highlights
Throughout his career, Yasuyuki Semba has worked with esteemed organizations, including the National Institute of Advanced Industrial Science and Technology and Sii Nanotechnology Inc. His experience in these institutions has contributed to his expertise in nanotechnology and materials science.
Collaborations
Yasuyuki Semba has collaborated with notable colleagues such as Hiroyuki Akinaga and Hiroshi Yokoyama. These collaborations have likely enriched his research and development efforts in the field.
Conclusion
Yasuyuki Semba's innovative work in scanning magnetic force microscopy exemplifies the importance of advancements in technology. His contributions continue to influence the field and pave the way for future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile