The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2009
Filed:
Dec. 28, 2005
Hiroyuki Akinaga, Tsukuba, JP;
Yasuyuki Semba, Tsukuba, JP;
Hiroshi Yokoyama, Tsukuba, JP;
Masatoshi Yasutake, Chiba, JP;
Hiromi Kuramochi, Chiba, JP;
Hiroyuki Akinaga, Tsukuba, JP;
Yasuyuki Semba, Tsukuba, JP;
Hiroshi Yokoyama, Tsukuba, JP;
Masatoshi Yasutake, Chiba, JP;
Hiromi Kuramochi, Chiba, JP;
National Institute of Advanced Industrial Science and Technology, Chiyoda-ku, JP;
SII Nanotechnology Inc., Mihama-ku, JP;
Abstract
The present invention provides a probe for a scanning magnetic force microscope having a resolution sufficient to allow observation of a magnetic storage medium with 1200 kFCI or higher recording densities, a method for producing the probe, and a method for forming a ferromagnetic alloy film on a carbon nanotube. In the context of the present invention, the probe for a scanning magnetic force microscope comprises a carbon nanotube whose surface is at least in part coated with a ferromagnetic alloy film consisting of any one of a Co—Fe alloy and a Co—Ni alloy, wherein the arithmetic mean roughness (Ra 10 μm) of the surface of the ferromagnetic alloy film is controlled to 1.15 nm or less. A method for producing such probes for a scanning magnetic force microscope and a method for forming such a ferromagnetic alloy film on a carbon nanotube, so as to achieve such mean surface roughness by controlling the growth rate of the ferromagnetic alloy film within the range of 1.0 to 2.5 nm/min, is also disclosed.