This inventor holds 2 USPTO granted patents. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1993-2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Amagasaki, JP (1993)
- Tokyo, JP (2008)
Company Filing History:
Years Active: 1993-2008
Title: Yasuyuki Nakaoka: Innovator in Sensor Technology
Introduction
Yasuyuki Nakaoka is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of sensor technology, holding two patents that showcase his innovative approach to engineering and design.
Latest Patents
Nakaoka's latest patents include a sensor chip breaking strength inspection apparatus and a sensor chip breaking strength inspection method. The apparatus is designed to perform inspections on semiconductor wafers that contain multiple sensor chips with diaphragm portions. It features a stage for mounting the wafer and a nozzle that emits a medium at a pressure equivalent to the standard breaking strength of the sensor chips. His second patent, a dispersion plating method, involves conducting plating while a liquid containing abrasive grains is brought into contact with the surface of an object. This method ensures that only abrasive grains are entrapped in a metal matrix after washing with water.
Career Highlights
Yasuyuki Nakaoka is associated with Mitsubishi Denki Kabushiki Kaisha, a leading company in the electronics and technology sector. His work has been instrumental in advancing sensor technology, particularly in the areas of strength inspection and plating methods.
Collaborations
Nakaoka has collaborated with notable coworkers, including Minoru Fujita and Toshikazu Izumo. Their combined expertise has contributed to the successful development of innovative technologies within their field.
Conclusion
Yasuyuki Nakaoka's contributions to sensor technology through his patents reflect his dedication to innovation and engineering excellence. His work continues to influence advancements in the industry, showcasing the importance of research and development in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
