Yasukuni Nomura

Title: Yasukuni Nomura: Innovator in Wafer Measurement Technologies

Introduction

Yasukuni Nomura is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of wafer measurement technologies, holding a total of 3 patents. His innovative approaches have advanced the precision and efficiency of measuring methods in semiconductor manufacturing.

Latest Patents

Nomura's latest patents include a measuring method that involves storing thickness data of chips held on a holding surface. This method captures thickness measurements at multiple points and calculates an average thickness while excluding certain measurement points. Another notable patent is a notch detecting method designed to identify notches in the outer circumferential portion of a wafer. This method includes steps for placing the wafer on a rotary table, capturing images, and determining the presence of irregularly shaped areas that may indicate notches.

Career Highlights

Yasukuni Nomura is currently employed at Disco Corporation, where he continues to develop innovative technologies in the semiconductor industry. His work has been instrumental in enhancing the accuracy of wafer measurements, which is crucial for the production of high-quality semiconductor devices.

Collaborations

Nomura collaborates with talented coworkers such as Shinji Yoshida and Koji Hashimoto. Together, they contribute to the advancement of technologies that support the semiconductor manufacturing process.

Conclusion

Yasukuni Nomura's contributions to wafer measurement technologies exemplify his dedication to innovation in the semiconductor industry. His patents reflect a commitment to improving measurement accuracy and efficiency, making a lasting impact on the field.