Yasuhiro Okumoto

Title: Yasuhiro Okumoto: Innovator in Metrology and Integrated Circuit Structures

Introduction

Yasuhiro Okumoto is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of metrology and integrated circuit structures, holding a total of 5 patents. His work has advanced the understanding and development of technologies essential for modern electronics.

Latest Patents

One of Okumoto's latest patents is titled "Combined optical profilometry and projection microscopy of integrated circuit structures." This innovative metrology method and system involves obtaining a projection image of structures on a wafer using a first metrology apparatus. Additionally, a profile of another portion of the structure is obtained using a second metrology apparatus. The information from both sources is then combined using a processor to enhance measurement accuracy. Another significant patent is "Structures and method with bitline self-aligned to vertical connection." This invention describes a method to integrate the metal bitline with vertical interconnections to capacitors, allowing for improved design and functionality in integrated circuits.

Career Highlights

Throughout his career, Yasuhiro Okumoto has worked with prominent companies such as Texas Instruments Corporation and Timbre Technologies, Inc. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies in the semiconductor industry.

Collaborations

Okumoto has collaborated with talented individuals in his field, including Wenge Yang and Junwei Bao. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

Yasuhiro Okumoto's contributions to metrology and integrated circuit structures highlight his role as a leading inventor in the technology sector. His patents reflect a commitment to advancing the field and improving the efficiency of electronic devices.