Starkville, MS, United States of America

Yaroslav Koshka

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Mississippi State University. Active years: 2004-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Yaroslav Koshka. Retrieved from https://idiyas.com/inventor/yaroslav-koshka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3


Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 2004-2011

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3 patents (USPTO):Explore Patents

Title: Yaroslav Koshka: Innovator in Silicon Carbide Technology

Introduction

Yaroslav Koshka is a prominent inventor based in Starkville, MS (US). He has made significant contributions to the field of semiconductor technology, particularly in the development of silicon carbide (SiC) devices. With a total of 3 patents, Koshka's work focuses on improving the fabrication processes of these critical materials.

Latest Patents

Koshka's latest patents include innovative methods that enhance the efficiency and quality of silicon carbide device fabrication. One of his notable inventions is a method for self-aligned fabrication of silicon carbide semiconductor devices. This technique reduces the number of photolithographic steps required, simplifies the alignment of different device regions, and minimizes spacing between these regions. The method utilizes low-temperature selective epitaxial growth, which prevents the degradation of various masking materials that are essential for this process.

Another significant patent is a method for epitaxial growth of silicon carbide using chemical vapor deposition (CVD). This method employs halogenated carbon precursors and controls the gas-phase interaction of halogen-containing intermediate chemical products involving silicon and carbon. This ensures high quality and homogeneity across the silicon carbide crystals. Additionally, it allows for the achievement of device-quality epitaxial layers at lower growth temperatures, which can be applied to forming SiC device regions of desirable shapes and dimensions.

Career Highlights

Yaroslav Koshka is affiliated with Mississippi State University, where he continues to advance research in semiconductor technologies. His work has garnered attention for its potential to significantly improve the production of high-quality silicon carbide materials and devices.

Collaborations

Koshka collaborates with esteemed colleagues such as Jeffrey Casady and Geoffrey Ewald Carter. Their combined expertise contributes to the innovative research and development efforts in the field of silicon carbide technology.

Conclusion

Yaroslav Koshka's contributions to silicon carbide technology through his patents and research at Mississippi State University highlight his role as a key innovator in the semiconductor industry. His work not only enhances fabrication processes but also paves the way for advancements in high-quality semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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