Yang Shang

Title: Innovations by Yang Shang in Time-Domain Reflectometry

Introduction

Yang Shang is an accomplished inventor based in Singapore, SG. He has made significant contributions to the field of time-domain reflectometry, particularly in the detection of defects in devices under test. His innovative approach has the potential to enhance the quality assurance processes in semiconductor manufacturing.

Latest Patents

Yang Shang holds a patent titled "Method, apparatus, and non-transitory computer medium for detecting defects of a device under test using time-domain reflectometry." This patent describes a method and apparatus for soft defects modeling of measurements using time-domain reflectometry. The technology, known as Electro-Optic Sampling based Time-Domain Reflectometry (EOS-TDR), allows for the rapid detection of soft defects in a chip under test. The method can identify defects at a high resolution from each pin, utilizing a reference model established from chips that meet expected quality standards. This automated analysis can detect soft defects that may otherwise go unnoticed due to various environmental and operational variations.

Career Highlights

Yang Shang is currently employed at Adv Antest Corporation, where he continues to develop innovative solutions in the field of semiconductor testing. His work focuses on improving the accuracy and efficiency of defect detection methods, which is crucial for maintaining high-quality standards in electronic devices.

Collaborations

Yang collaborates with Masaichi Hashimoto, a fellow innovator in the field. Their combined expertise contributes to advancements in technology and the development of new methodologies for defect detection.

Conclusion

Yang Shang's contributions to time-domain reflectometry exemplify the importance of innovation in the semiconductor industry. His patent and ongoing work at Adv Antest Corporation highlight his commitment to enhancing device testing methodologies.