Yafei Shen

Title: Yafei Shen: Innovator in Optical Measurement Technologies

Introduction

Yafei Shen is a prominent inventor based in Wuhan, China. He has made significant contributions to the field of optical measurement technologies, holding a total of 5 patents. His work focuses on enhancing the accuracy and efficiency of measurement devices, particularly in the realm of LED display calibration and automatic optical inspection.

Latest Patents

One of Yafei Shen's latest patents is a chromaticity measurement method and device for the calibration of tiled LED display screens. This innovative method offers convenience in operation and accurate measurement. The process involves imaging emergent light from the tiled LED display screen using an objective lens, followed by receiving and splitting the light beam to obtain chromaticity and spectrum information from various regions of the display. This technology ensures precise calibration and correction based on measurement results.

Another notable patent is an automatic optical inspection device based on a CPU+GPU+FPGA architecture. This device includes an image storage unit, an image computing unit, and an image acquisition unit. The system is designed to transmit configuration parameters and test commands, facilitating efficient image processing and analysis.

Career Highlights

Yafei Shen has worked with several reputable companies, including Wuhan Jingce Electronic Group Co., Ltd. and Wuhan Jingli Electronic Technology Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative technologies, contributing to advancements in optical measurement.

Collaborations

Yafei Shen has collaborated with notable colleagues such as Biaohua Deng and Changdong Ou. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Yafei Shen's contributions to optical measurement technologies have established him as a key figure in his field. His innovative patents and collaborative efforts continue to influence advancements in measurement accuracy and efficiency.