The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Jul. 09, 2018
Wuhan Jingce Electronic Group Co., Ltd., Wuhan, CN;
Xiaofan Feng, Wuhan, CN;
Zengqiang Zheng, Wuhan, CN;
Zhao Liu, Wuhan, CN;
Erwei Ma, Wuhan, CN;
Hongjun Wu, Wuhan, CN;
Ronghua Liu, Wuhan, CN;
Yafei Shen, Wuhan, CN;
WUHAN JINGCE ELECTRONIC GROUP CO., LTD., Wuhan, CN;
Abstract
The invention discloses a method for evaluating a brightness measurement accuracy of a Demura equipment by generating a noise-added image by adding a random number to an original grayscale image and obtaining a measurement value corresponding to the added random number via the noise-added image displayed by the Demura equipment. The brightness measurement accuracy of the Demura equipment is evaluated based on a correlation between the measured value and the originally added random number to measure a brightness extraction performance of the Demura equipment. The method provided by the invention provides a quantitative and measurable determining method that may better reflect the actual performance of the Demura equipment.