The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 2020
Filed:
Sep. 07, 2016
Wuhan Jingce Electronic Group Co., Ltd., Hubei, CN;
Fangbo Lu, Hubei, CN;
Feng Yao, Hubei, CN;
Biaohua Deng, Hubei, CN;
Kai Chen, Hubei, CN;
Yafei Shen, Hubei, CN;
WUHAN JINGCE ELECTRONIC GROUP CO., LTD., Hubei, CN;
Abstract
The present disclosure discloses a GPU-based TFT-LCD Mura defect detection method, comprising: (1) establishing a studentized residual based double-second-order regression diagnosis model based original image data to obtain double-second-order regression background data; (2) obtaining influence quantities of respective data points on fitted values according to the original image data and the double-second-order regression background image data; (3) excluding outliers and influential points in the original image data according to the influence quantities to obtain a new pixel point set; (4) establishing a double-N-order polynomial surface fitting model according to the new pixel point set to obtain double-N-order background image data; (5) obtaining a residual image R according to the double-N-order background image data and the original image data, and performing threshold segmentation on the residual image to obtain a threshold segmentation image; and (6) performing morphological processing on the threshold segmentation image to obtain an eroded and dilated image, thereby achieving effective segmentation of Mura defects with uneven brightness distribution.