This inventor holds 2 USPTO granted patents. Top assignee: Wuhan Jingce Electronic Group Co., Ltd.. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Innovations of Feng Yao in Display Panel Detection
Introduction
Feng Yao is a notable inventor based in Hubei, China. He has made significant contributions to the field of optical detection for display panels. With a total of 2 patents, his work focuses on enhancing the accuracy and efficiency of defect detection methods.
Latest Patents
Feng Yao's latest patents include a background suppression method and detecting device in automatic optical detection of display panels. This innovation involves collecting a pure color image of the display panel and performing multi-level wavelet decomposition to obtain high-frequency and low-frequency sub-bands. The method enhances contrast while suppressing background textures, ensuring that defects are clearly visible. Another significant patent is the GPU-based TFT-LCD Mura defect detection method. This method utilizes a double-second-order regression diagnosis model to effectively segment Mura defects with uneven brightness distribution, improving the reliability of defect detection in display panels.
Career Highlights
Feng Yao is currently employed at Wuhan Jingce Electronic Group Co., Ltd. His work at this company has allowed him to develop and refine his innovative detection methods, contributing to advancements in the display technology industry.
Collaborations
Feng Yao has collaborated with notable coworkers, including Yafei Shen and Fangbo Lu. Their combined expertise has fostered a productive environment for innovation and development in their field.
Conclusion
Feng Yao's contributions to the field of optical detection for display panels demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of technology and a drive to improve defect detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile