The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 2021
Filed:
Apr. 30, 2020
Wuhan Jingce Electronic Group Co., Ltd., Wuhan, CN;
Yafei Shen, Wuhan, CN;
Changdong Ou, Wuhan, CN;
Biaohua Deng, Wuhan, CN;
Zhou Wang, Wuhan, CN;
Linhai Mei, Wuhan, CN;
Wenzhong Dong, Wuhan, CN;
Wentian Tang, Wuhan, CN;
Bo Li, Wuhan, CN;
WUHAN JINGCE ELECTRONIC GROUP CO., LTD., Wuhan, CN;
Abstract
An automatic optical inspection device, including an image storage unit; an image computing unit; and an image acquisition unit. The image storage unit includes a first communication interface and a second communication interface. The image computing unit includes a first optical interface, a second optical interface, a third optical interface, and a fourth optical interface; the image acquisition unit includes a third communication interface and a camera interface. The image storage unit is configured to transmit configuration parameters and test commands to the image computing unit, receive a test result transmitted from the image computing unit via the first communication interface, and receive data from the image acquisition unit via the second communication interface. The image computing unit is configured to receive the configuration parameters and test commands from the image storage unit, and transmit the test result to the image storage unit via the first fiber interface.