Albany, NY, United States of America

Xu-Ming Wang


Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 38(Granted Patents)


Company Filing History:


Years Active: 2012-2014

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2 patents (USPTO):Explore Patents

Title: Innovations of Xu-Ming Wang in Optical Metrology and Imaging

Introduction

Xu-Ming Wang is a notable inventor based in Albany, NY (US), recognized for his contributions to the field of optics and imaging. With a total of two patents to his name, Wang has made significant strides in developing advanced methods and systems for optical metrology and coded aperture imaging.

Latest Patents

Wang's latest patents include a method for the metrology of optics with high aberrations. This innovative interferometry method involves situating a sample under test between a tilt mirror and a reference mirror. The tilt mirror is designed to be tiltable with at least one degree of freedom and translatable along an axial line defined by the direction of propagation of a test wavefront. The method allows for the derivation of a substantially complete first-tilt-alignment wavefront metrology of the sample under test from a series of interferograms.

Another significant patent by Wang is a holography-based device, system, and method for coded aperture imaging. This system processes a scene wavefront from a target scene through an original coded aperture mask onto a focal plane array, producing a diffracted projection. The diffracted projection is then processed into a representation of the target scene by correlating it with a known array pattern of the coded aperture mask.

Career Highlights

Xu-Ming Wang is currently employed at Applied Science Innovations, Inc., where he continues to push the boundaries of optical technology. His work has been instrumental in enhancing the precision and capabilities of optical measurements and imaging systems.

Collaborations

Wang collaborates with Mikhail A. Gutin, contributing to the advancement of their shared research interests in optics and imaging technologies.

Conclusion

Xu-Ming Wang's innovative patents and contributions to optical metrology and imaging highlight his role as a leading inventor in his field. His work continues to influence advancements in optical technologies and applications.

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