Applied Science Innovations, Inc.

Xu-Ming Wang

Mikhail A Gutin

An interferometry method and associated system and computerized media for testing samples under test including those with high aberrations, comprising: situating a sample under test between a tilt mirror and a reference mirror, the tilt mirror tiltable with at least one degree of freedom about at least one tilt mirror axis, and further translatable along an axial line defined by a direction of propagation of a test wavefront from a source thereof; propagating the test wavefront toward the tilt mirror; after the test wavefront has been reflected by the tilt mirror, further propagating the test wavefront toward a reference mirror; and deriving a substantially complete first-tilt-alignment wavefront metrology of the sample under test from a plurality of first-tilt-alignment interferograms taken with the tilt mirror held fixed at a first predetermined tilt mirror angle while discreetly varying a displacement between the sample under test and the reference mirror.

Metrology of optics with high aberrations

A system and related method for coded aperture sensing, comprising: passing at least one scene wavefront from a target scene through at least one original coded aperture mask onto a focal plane array, producing a diffracted projection of the target scene; and processing the diffracted projection into a representation of the target scene by correlating a function of the diffracted projection with a function of a known array pattern of the at least one original coded aperture mask and by using at least one reconstructing wavefront for holographic reconstructing.

Growing community of inventors

Albany, NY, United States of America

Xu-Ming Wang