Location History:
- Santa Clara, CA (US) (2009)
- Fremont, CA (US) (2012 - 2016)
Company Filing History:
2 out of 1,787 
1 out of 641 
Years Active: 2009-2016
Title: The Innovations of Inventor Xing Chu
Introduction
Xing Chu is a notable inventor based in Fremont, CA, who has made significant contributions to the field of technology. With a total of 3 patents to his name, he has focused on advancements in defect detection and inspection methods in semiconductor manufacturing.
Latest Patents
One of his latest patents is titled "Detecting defects on a wafer using template image matching." This invention provides various embodiments for detecting defects on a wafer by matching a template image to the output of an electron beam inspection system. The method applies defect detection parameters to pixels based on their location within the device, allowing for effective defect identification. Another significant patent is "Memory cell and page break inspection." This method involves inspecting an array of memory blocks and page breaks by imaging the array, dividing it into sections, and selecting candidate images for further analysis. The process includes inspecting pixels to determine edges of memory blocks and comparing images to flag potential defects.
Career Highlights
Xing Chu has worked with prominent companies in the industry, including KLA-Tencor Corporation and KLA-Tencor Technologies Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas in semiconductor technology.
Collaborations
Throughout his career, Xing has collaborated with talented individuals such as Jason Z Lin and Kenong Wu. These partnerships have contributed to the advancement of his projects and the successful development of his patents.
Conclusion
Xing Chu's work in the field of semiconductor technology showcases his innovative spirit and dedication to improving defect detection methods. His contributions continue to influence the industry and pave the way for future advancements.