Company Filing History:
Years Active: 2025
Title: Innovations by Xiaoying Hou
Introduction
Xiaoying Hou is a notable inventor based in Anhui, China. He has made significant contributions to the field of measurement systems, particularly in detecting deep-hole surface topography. His innovative approach utilizes low-coherence interferometry, showcasing his expertise and creativity in engineering.
Latest Patents
Xiaoying Hou holds a patent for a "Measurement system for detecting deep-hole surface topography based on low-coherence interferometry." This system includes a detection part and an autocollimation system. The detection part features a white light interferometric system, which consists of a 1550 nm amplified spontaneous emission (ASE) broadband light source, a first reflector, a first beam splitting prism, a second reflector, and a reference reflector arranged in sequence. A to-be-measured deep-hole and a near-infrared camera are positioned on either side of the first beam splitting prism, with a conical prism placed inside the deep-hole. The autocollimation system, located between the deep-hole and the first beam-splitting prism, includes a 630 nm light source, a dichroic prism, a second beam-splitting prism, a third reflector, and a quadrant detector arranged in sequence. This innovative patent demonstrates Hou's commitment to advancing measurement technology.
Career Highlights
Xiaoying Hou is affiliated with Hefei University of Technology, where he contributes to research and development in engineering. His work has garnered attention for its practical applications and technical sophistication. With a focus on precision measurement, he continues to push the boundaries of what is possible in his field.
Collaborations
Xiaoying Hou collaborates with esteemed colleagues such as Huining Zhao and Jie Wang. Their combined expertise fosters a productive research environment, leading to innovative solutions and advancements in technology.
Conclusion
Xiaoying Hou's contributions to the field of measurement systems exemplify the spirit of innovation. His patent on low-coherence interferometry highlights his technical skills and dedication to improving measurement accuracy. Through his work at Hefei University of Technology and collaborations with fellow researchers, he continues to make a significant impact in his field.
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