This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Innovations of Xiaoqian Xu in Surface Defect Detection
Introduction
Xiaoqian Xu is a prominent inventor based in San Jose, CA (US). She has made significant contributions to the field of surface defect detection through her innovative patent. Her work focuses on enhancing the accuracy and efficiency of identifying defects on substrates, which is crucial in various manufacturing processes.
Latest Patents
Xiaoqian Xu holds a patent titled "Detecting and classifying surface defects with multiple radiation collectors." This invention presents a sophisticated system designed to detect and classify defects on the surface of a substrate. The system utilizes multiple targeting and collecting assemblies to analyze radiation reflected and scattered from the substrate. The processor in the system is equipped with logic instructions that enable it to analyze the collected signals and effectively detect and classify defects.
Career Highlights
Xiaoqian Xu is currently employed at Kla Tencor Corporation, where she continues to develop innovative solutions in her field. Her expertise in surface defect detection has positioned her as a valuable asset to her team and the company.
Collaborations
Some of her notable coworkers include Steven W Meeks and Hung Phi Nguyen, who collaborate with her on various projects at Kla Tencor Corporation.
Conclusion
Xiaoqian Xu's contributions to the field of surface defect detection exemplify her innovative spirit and dedication to advancing technology. Her patent reflects her commitment to improving manufacturing processes through precise defect identification.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile